HIPER TEM nagoya microscopy Nagoya University High Voltage Electron Microscope Facility of Ecotopia Science Institute
Outline Equipments Research Lab Reports Support System Application（Request for analysis）
JAPANESE SITEContact UsAccessHOME
▼Purpose   ▼Service Outline
Purpose
Void formed by wireless solder and electroless nickel plating.
Void formed by wireless solder and electroless nickel plating.
The High Voltage Electron Microscope Laboratory of Ecotopia Science Institute, Nagoya University is currently contributing in the "High Performance Electron Microscopy in Support of Bio and Nanoscience" as part of the "Open Advanced Research Facilities Initiative" program provided by the Ministry of Education, Culture, Sports, Science and Technology of Japan.

This program offers advantageous environment for research by granting various research centers in industries, universities, and public experimental institutions the opportunity to share supplies and equipments.

Specifically, our facility provides the project with high performance electron microscopes, including the high voltage scanning transmission electron microscope.

The world's top-level experts of the electron microscopy will perform total support, including experimental design, sample preparation, and analysis of obtained results.
Chief Professor: Nobuo Tanaka
▲TO TOP
Service Outline
The support service consists of the following description.
On cost Use
[1] Scientific results will belong only to the client.
[2] All data will be kept confidential even after service. (If desired not to be open)
[3] Guidance from full-time expert for sample production, observation, and analysis.
▲TO TOP
High Voltage Electron Microscope Facility
Reaction Science high-voltage scanning transmission electron microscope
High Voltage Scanning Transmission Electron Microscope
Electron Microscope Cluster
3D Electron Microscope
High resolution electron microscope
Electron Spectroscopic Microscope
Analysis Electron Microscope
High resolution electron microscope
Biological electron microscope
Aberration Corrected Electron Microscope
Scanning Electron Microscope
Field emission electron microscope
200kV General purpose electron microscope
Sample Preparation Devices
Focused Ion Beam Sample Preparation System
Low accelerating ion milling Gentle Mill Model IV5
Fine ion milling GATAN PIPS Model 691
NTT-AT/Petit polisher POP-101
Meiwa/Carbon coater CADE-E
Nagoya University | High Voltage Electron Microscope Facility of Ecotopia Science Institute. A zip code:464-8603 Furocho, Chikusa-ku, Nagoya, Japan　Tel & Fax 052-789-3632 Copyright © 2009 Nagoya University Ecotopia Science Institute
Nagoya University | High Voltage Electron Microscope Facility of Ecotopia Science Institute